Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .
Jayashree SaxenaKenneth M. ButlerJohn GattR. RaghuramanSudheendra Phani KumarSupatra BasuDavid J. CampbellJohn BerechPublished in: ITC (2002)
Keyphrases
- low cost
- model based testing
- test cases
- hardware software co design
- software testing
- test data
- hardware and software
- test suite
- open issues
- test generation
- lessons learned
- software development
- key issues
- regression testing
- test sequences
- information systems
- test case generation
- embedded software
- code coverage
- neural network
- statistical tests
- implementation details
- fault detection
- highly efficient
- tool support
- low power
- training set
- artificial intelligence
- database