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Defect-Oriented Testing and Defective-Part-Level Prediction.
Jennifer Dworak
Jason D. Wicker
Sooryong Lee
Michael R. Grimaila
M. Ray Mercer
Kenneth M. Butler
Bret Stewart
Li-C. Wang
Published in:
IEEE Des. Test Comput. (2001)
Keyphrases
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prediction accuracy
levels of abstraction
lower level
data sets
neural network
artificial intelligence
decision trees
case study
evolutionary algorithm
long term
test set
test cases
prediction error
prediction algorithm
defect detection