New drain current model for nano-meter MOS transistors on-chip threshold voltage test.
Jinbo WanHans G. KerkhoffPublished in: ETS (2015)
Keyphrases
- management system
- theoretical analysis
- formal model
- statistical model
- mathematical model
- parameter estimation
- probability distribution
- probabilistic model
- cost function
- computational intelligence
- high speed
- data sets
- computational model
- theoretical framework
- prior knowledge
- experimental data
- simulation model
- objective function