Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor.

Yong Zhao Hans G. Kerkhoff

Published in: DSD (2015)

Keyphrases

functional verification
functional units
real time
level parallelism
monitoring system
high speed
test cases
software aging
data sets
processing units
computer architecture
low power
age estimation
test data
test set
image restoration
decision support