Login / Signup

Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications.

Jerrin PathroseLeon van de LogtHans G. Kerkhoff
Published in: DFT (2019)
Keyphrases
  • management system
  • cross platform
  • real time
  • natural language interface
  • vlsi architecture
  • multi tasking
  • knowledge management
  • signal processing
  • analog vlsi
  • e learning
  • test cases
  • ambient intelligence