Login / Signup
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications.
Jerrin Pathrose
Leon van de Logt
Hans G. Kerkhoff
Published in:
DFT (2019)
Keyphrases
</>
management system
cross platform
real time
natural language interface
vlsi architecture
multi tasking
knowledge management
signal processing
analog vlsi
e learning
test cases
ambient intelligence