Konstantin Shibin

Publication Activity (10 Years)

Years Active: 2013-2024
Publications (10 Years): 9

Top Topics

Special Session

Data Collection And Analysis

Fault Detection

Cross Disciplinary

Top Venues

Publications

Maksim Jenihhin, Mahdi Taheri, Natalia Cherezova, Mohammad Hasan Ahmadilivani, Hardi Selg, Artur Jutman, Konstantin Shibin, Anton Tsertov, Sergei Devadze, Rama Mounika Kodamanchili, Ahsan Rafiq, Jaan Raik, Masoud Daneshtalab
Keynote: Cost-Efficient Reliability for Edge-AI Chips. LATS (2024)
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
On-Chip Sensors Data Collection and Analysis for SoC Health Management. DFT (2023)
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
On-Chip Sensors Data Collection and Analysis for SoC Health Management. CoRR (2023)
Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken
Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure. IEEE Des. Test 34 (6) (2017)
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures. J. Electron. Test. 32 (3) (2016)
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Designing reliable cyber-physical systems overview associated to the special session at FDL'16. FDL (2016)
Konstantin Shibin, Sergei Devadze, Artur Jutman
On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs. LATS (2016)
Konstantin Shibin, Vivek Chickermane, Brion L. Keller, Christos Papameletis, Erik Jan Marinissen
At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic. ATS (2015)
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
Virtual reconfigurable scan-chains on FPGAs for optimized board test. LATS (2015)
Konstantin Shibin, Sergei Devadze, Artur Jutman
Asynchronous Fault Detection in IEEE P1687 Instrument Network. NATW (2014)
Artur Jutman, Sergei Devadze, Konstantin Shibin
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management. IEEE Des. Test 30 (5) (2013)