Keynote: Cost-Efficient Reliability for Edge-AI Chips.
Maksim JenihhinMahdi TaheriNatalia CherezovaMohammad Hasan AhmadilivaniHardi SelgArtur JutmanKonstantin ShibinAnton TsertovSergei DevadzeRama Mounika KodamanchiliAhsan RafiqJaan RaikMasoud DaneshtalabPublished in: LATS (2024)
Keyphrases
- cost efficient
- artificial intelligence
- edge detection
- ai systems
- governmental organizations
- machine learning
- expert systems
- high speed
- knowledge based systems
- integrated circuit
- lecture notes in artificial intelligence
- intelligent systems
- edge detector
- knowledge representation and reasoning
- intelligent behavior
- edge information
- reliability analysis
- key issues
- ai technologies
- john mccarthy
- ai methods
- weighted graph
- failure rate
- multiple scales
- real time
- computer systems
- computational intelligence
- knowledge representation
- computer science
- data sets