Zahra Paria Najafi-Haghi

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 9

Top Topics

Defect Classification

Top Venues

Publications

Hans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi
Test Aspects of System Health State Monitoring. LATS (2023)
Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich
Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC (2023)
Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich
Identifying Resistive Open Defects in Embedded Cells under Variations. J. Electron. Test. 39 (1) (2023)
Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich
Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. DATE (2023)
Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich
On Extracting Reliability Information from Speed Binning. ETS (2022)
Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang
Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. ITC (2022)
Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphael Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann
Intelligent Methods for Test and Reliability. DATE (2022)
Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich
Resistive Open Defect Classification of Embedded Cells under Variations. LATS (2021)
Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich
Variation-Aware Defect Characterization at Cell Level. ETS (2020)