Login / Signup
Resistive Open Defect Classification of Embedded Cells under Variations.
Zahra Paria Najafi-Haghi
Hans-Joachim Wunderlich
Published in:
LATS (2021)
Keyphrases
</>
defect classification
embedded systems
control software
genetic algorithm
control system
data sets
image processing
image segmentation
multiresolution
signal processing
manufacturing cell