Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning.
Yiwen LiaoZahra Paria Najafi-HaghiHans-Joachim WunderlichBin YangPublished in: ITC (2022)
Keyphrases
- deep learning
- defect detection
- unsupervised learning
- weakly supervised
- deep architectures
- deep belief networks
- machine learning
- unsupervised feature learning
- semi supervised
- supervised learning
- natural language processing
- restricted boltzmann machine
- model selection
- text mining
- multi class
- feature extraction
- image processing