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Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.

Felix NeubauerJan BurchardPascal RaiolaJochen RivoirBernd BeckerMatthias Sauer
Published in: VTS (2018)
Keyphrases
  • constraint solver
  • constraint solving
  • constraint propagation
  • linear constraints
  • neural network
  • sufficient conditions
  • constraint satisfaction problems
  • constraint programming
  • integrated circuit