Test Roles in Diagnosis and Silicon Debug.

Anis Uzzaman Fidel Muradali Takashi Aikyo Robert C. Aitken Tom Jackson Rajesh Galivanche Takeshi Onodera

Published in: ATS (2007)

Keyphrases

diagnostic tests
fault diagnosis
test data
low cost
model based diagnosis
real time
data mining
high speed
statistical tests
fault detection
high density
neural network
artificial intelligence
medical diagnosis
transmission electron microscopy