Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing.
Karen ChowDavid AbercrombieMark BaselPublished in: SoCC (2006)
Keyphrases
- main contribution
- probabilistic model
- synthetic data
- preprocessing
- neural network
- prior knowledge
- cost function
- support vector machine
- evaluation method
- detection method
- theoretical analysis
- high accuracy
- experimental evaluation
- computational complexity
- computationally efficient
- dynamic programming
- significant improvement
- support vector machine svm
- segmentation algorithm
- error rate
- video sequences
- clustering algorithm