M. Enamul Amyeen

Publication Activity (10 Years)

Years Active: 1999-2022
Publications (10 Years): 12

Top Topics

Data Collection

Symbolic Execution

Test Generation

Synthetic Datasets

Top Venues

ACM Trans. Design Autom. Electr. Syst.

Publications

Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman
Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. ATS (2022)
Irith Pomeranz, M. Enamul Amyeen
Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (8) (2021)
Irith Pomeranz, M. Enamul Amyeen
Logic Diagnosis with Hybrid Fail Data. ACM Trans. Design Autom. Electr. Syst. 26 (3) (2021)
Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT (2018)
Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. Very Large Scale Integr. Syst. 25 (4) (2017)
Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. ITC (2017)
Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Test Modification for Reduced Volumes of Fail Data. ACM Trans. Design Autom. Electr. Syst. 22 (4) (2017)
Shraddha Bodhe, M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
Diagnostic Fail Data Minimization Using an N-Cover Algorithm. IEEE Trans. Very Large Scale Integr. Syst. 24 (3) (2016)
Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. VTS (2016)
M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma
A novel diagnostic test generation methodology and its application in production failure isolation. ITC (2016)
M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. ATS (2016)
Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen
Diagnostic resolution improvement through learning-guided physical failure analysis. ITC (2016)
M. Enamul Amyeen
Innovative practices session 5C: Advancements in test -keeping moore moving! VTS (2015)
Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen
Built-in generation of functional broadside tests considering primary input constraints. ACM Great Lakes Symposium on VLSI (2014)
M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan
Logic BIST silicon debug and volume diagnosis methodology. ITC (2011)
Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Defect diagnosis based on DFM guidelines. VTS (2010)
M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak
Microprocessor system failures debug and fault isolation methodology. ITC (2009)
Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects. ATS (2008)
Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS (2007)
Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau
Testing for systematic defects based on DFM guidelines. ITC (2007)
M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman
Improving Precision Using Mixed-level Fault Diagnosis. ITC (2006)
Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS (2006)
Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS (2006)
Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design (2004)
M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC (2004)
Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS (2004)
Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS (2003)
M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
Fault equivalence identification in combinational circuits using implication and evaluation techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22 (7) (2003)
M. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs
Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. VTS (2002)
M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. VTS (2001)
M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
Implication and Evaluation Techniques for Proving Fault Equivalence. VTS (1999)