Logic BIST silicon debug and volume diagnosis methodology.
M. Enamul AmyeenAndal JayalakshmiSrikanth VenkataramanSundar V. PathyEwe C. TanPublished in: ITC (2011)
Keyphrases
- built in self test
- model based diagnosis
- high density
- fault diagnosis
- classical logic
- medical diagnosis
- automated reasoning
- multi valued
- diagnostic reasoning
- volume rendering
- model based reasoning
- causal reasoning
- logic programming
- low cost
- fault detection
- modal logic
- asynchronous circuits
- automatic diagnosis
- attention deficit hyperactivity disorder
- high speed