Test Modification for Reduced Volumes of Fail Data.
Irith PomeranzM. Enamul AmyeenSrikanth VenkataramanPublished in: ACM Trans. Design Autom. Electr. Syst. (2017)
Keyphrases
- data sets
- data collection
- application domains
- high quality
- synthetic data
- data processing
- data distribution
- complex data
- knowledge discovery
- image data
- small number
- data mining techniques
- database
- data sources
- data analysis
- data structure
- neural network
- big data
- data quality
- data objects
- survey data
- original data
- raw data
- sensor data
- statistical analysis
- computer systems
- training data
- real time