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Built-in generation of functional broadside tests considering primary input constraints.
Bo Yao
Irith Pomeranz
Srikanth Venkataraman
M. Enamul Amyeen
Published in:
ACM Great Lakes Symposium on VLSI (2014)
Keyphrases
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resource constraints
functional analysis
genetic algorithm
constraint satisfaction
constrained optimization
user input
linear constraints
constraint sets
database
real time
information systems
search algorithm
co occurrence
global constraints
constraint solving
multiple constraints