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Impact of Multiple-Detect Test Patterns on Product Quality.

Brady BenwareChris SchuermyerSreenevasan RanganathanRobert MadgePrabhu KrishnamurthyNagesh TamarapalliKun-Han TsaiJanusz Rajski
Published in: ITC (2003)
Keyphrases
  • product quality
  • process control
  • quality control
  • manufacturing processes
  • real time
  • quality improvement
  • computer vision
  • knowledge acquisition
  • world wide
  • manufacturing process
  • software process
  • software product