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Impact of Multiple-Detect Test Patterns on Product Quality.
Brady Benware
Chris Schuermyer
Sreenevasan Ranganathan
Robert Madge
Prabhu Krishnamurthy
Nagesh Tamarapalli
Kun-Han Tsai
Janusz Rajski
Published in:
ITC (2003)
Keyphrases
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product quality
process control
quality control
manufacturing processes
real time
quality improvement
computer vision
knowledge acquisition
world wide
manufacturing process
software process
software product