Defect Aware Test Patterns.

Huaxing Tang Gang Chen Sudhakar M. Reddy Chen Wang Janusz Rajski Irith Pomeranz

Published in: DATE (2005)

Keyphrases

real time
pattern discovery
data sets
data mining
information retrieval
feature selection
three dimensional
feature extraction
multiscale
association rules
relational databases
multi dimensional
sequential patterns
spatial patterns