S. Saqib Khursheed

Publication Activity (10 Years)

Years Active: 2005-2021
Publications (10 Years): 19

Top Topics

Database Replication

Design Methodology

Leakage Current

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya
IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs. ISCAS (2021)
Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults. DFT (2021)
Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi
Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs. IEEE Trans. Very Large Scale Integr. Syst. 29 (12) (2021)
Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi
Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current. DATE (2021)
Antonio Leonel Hernández Martínez, S. Saqib Khursheed, Daniele Rossi
Leveraging CMOS Aging for Efficient Microelectronics Design. IOLTS (2020)
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design. IEEE Trans. Circuits Syst. (11) (2020)
Srisubha Kalanadhabhatta, Kiran Kumar Anumandla, S. Saqib Khursheed, Amit Acharyya
Secure Scan Design with a Novel Methodology of Scan Camouflaging. ECCTD (2020)
Leonel Hernández Martínez, S. Saqib Khursheed, Sudhakar M. Reddy
LFSR generation for high test coverage and low hardware overhead. IET Comput. Digit. Tech. 14 (1) (2020)
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors. ITC-Asia (2019)
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy
Recycled IC detection through aging sensor. ETS (2018)
Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (4) (2018)
Rishad A. Shafik, Qiaoyan Yu, S. Saqib Khursheed, Antonio Miele
Welcome Message. DFT (2017)
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 25 (7) (2017)
Srinivas Sabbavarapu, Basireddy Karunakar Reddy, Amit Acharyya, S. Saqib Khursheed
Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing. J. Low Power Electron. 13 (3) (2017)
Vasileios Tenentes, Daniele Rossi, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure. IEEE Trans. Very Large Scale Integr. Syst. 25 (4) (2017)
Venkateshwarlu Y. Gudur, Sandeep Thallada, Abhinay R. Deevi, Venkata Krishna Gande, Amit Acharyya, Vasundhra Bhandari, Paresh Sharma, S. Saqib Khursheed, Ganesh R. Naik
Reconfigurable hardware-software codesign methodology for protein identification. EMBC (2016)
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi, Zhiwen Zhao
Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs. VLSI-SoC (2016)
Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi
Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. Very Large Scale Integr. Syst. 24 (8) (2016)
S. Saqib Khursheed, Pascal Vivet, Fabian Hopsch, Erik Jan Marinissen
Guest Editors' Introduction: Robust 3-D Stacked ICs. IEEE Des. Test 33 (3) (2016)
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. IOLTS (2015)
Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi
Diagnosis of power switches with power-distribution-network consideration. ETS (2015)
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. ETS (2015)
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi
Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE Trans. Very Large Scale Integr. Syst. 23 (8) (2015)
Vasileios Tenentes, S. Saqib Khursheed, Daniele Rossi, Sheng Yang, Bashir M. Al-Hashimi
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (12) (2015)
Sheng Yang, Rishad A. Shafik, S. Saqib Khursheed, David Flynn, Geoff V. Merrett, Bashir M. Al-Hashimi
Application-specific memory protection policies for energy-efficient reliable design. RSP (2015)
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Wei Zhao
Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (5) (2014)
S. Saqib Khursheed, Kan Shi, Bashir M. Al-Hashimi, Peter R. Wilson, Krishnendu Chakrabarty
Delay Test for Diagnosis of Power Switches. IEEE Trans. Very Large Scale Integr. Syst. 22 (2) (2014)
Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang
High Quality Testing of Grid Style Power Gating. ATS (2014)
Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Geoff V. Merrett
Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation. IEEE Trans. Circuits Syst. I Regul. Pap. (11) (2013)
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi
Impact of PVT variation on delay test of resistive open and resistive bridge defects. DFTS (2013)
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi
Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. Asian Test Symposium (2011)
Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn
Improved DFT for Testing Power Switches. ETS (2011)
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty
Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. Asian Test Symposium (2011)
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi
A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (11) (2011)
S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod
Test for Bridge Defects in Multivoltage Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (9) (2010)
Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed
Scan based methodology for reliable state retention power gating designs. DATE (2010)
S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu
Modeling the impact of process variation on resistive bridge defects. ITC (2010)
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE (2009)
S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (3) (2009)
Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod
Process Variation-Aware Test for Resistive Bridges. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (8) (2009)
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod
Bridging Fault Test Method With Adaptive Power Management Awareness. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (6) (2008)
S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
Bridge Defect Diagnosis for Multiple-Voltage Design. ETS (2008)
Urban Ingelsson, Paul M. Rosinger, S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
Resistive Bridging Faults DFT with Adaptive Power Management Awareness. ATS (2007)
Aiman El-Maleh, S. Saqib Khursheed
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET Comput. Digit. Tech. 1 (4) (2007)
Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (11) (2006)
Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation. Asian Test Symposium (2005)