Login / Signup
Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation.
Sheng Yang
S. Saqib Khursheed
Bashir M. Al-Hashimi
David Flynn
Geoff V. Merrett
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2013)
Keyphrases
</>
image processing
multiple input
neural network
case study
long term
power system
low power
power supply