LFSR generation for high test coverage and low hardware overhead.
Leonel Hernández MartínezS. Saqib KhursheedSudhakar M. ReddyPublished in: IET Comput. Digit. Tech. (2020)
Keyphrases
- high levels
- random number generator
- low cost
- test suite
- significantly lower
- hardware and software
- set of test cases
- low power consumption
- wide range
- real time
- generation method
- high noise
- high sensitivity
- low signal to noise ratio
- high correlation
- database
- test cases
- computing systems
- general purpose
- software testing
- image processing
- neural network
- high rate
- highly correlated
- hardware implementation
- hardware software
- random number
- database systems
- data sets
- high cost
- case study