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Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation.
Shida Zhong
S. Saqib Khursheed
Bashir M. Al-Hashimi
Sudhakar M. Reddy
Krishnendu Chakrabarty
Published in:
Asian Test Symposium (2011)
Keyphrases
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data analysis
machine learning
image segmentation
real world
data mining
image analysis
hidden markov models
process model
dynamic analysis