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Process Variation-Aware Test for Resistive Bridges.
Urban Ingelsson
Bashir M. Al-Hashimi
S. Saqib Khursheed
Sudhakar M. Reddy
Peter Harrod
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
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three dimensional
test cases
database
image processing
website
image sequences
bayesian networks
learning environment
object recognition
pairwise