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On the impact of gate oxide degradation on SRAM dynamic and static write-ability.

Vikas ChandraRobert C. Aitken
Published in: ASP-DAC (2011)
Keyphrases
  • leakage current
  • dynamic analysis
  • changing environment
  • dynamically changing
  • low voltage
  • data transmission
  • wireless sensor networks
  • key features
  • computer networks