Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS.

Vikas Chandra Robert C. Aitken

Published in: DFT (2008)

Keyphrases

power supply
low voltage
cmos technology
rapid development
high speed
cost effective
case study
low power
power system
computer systems
data processing
personal computer
error rate
key technologies
factors that influence
low cost
error analysis