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An On-Chip Self-Repair Calculation and Fusing Methodology.

Darren AnandBruce CowanOwen FarnsworthPeter JakobsenSteven F. OaklandMichael OuelletteDonald L. Wheater
Published in: IEEE Des. Test Comput. (2003)
Keyphrases
  • high speed
  • low cost
  • neural network
  • design methodology
  • modular design
  • analog vlsi
  • image sequences
  • expert systems
  • operating system
  • high density
  • circuit design
  • single chip
  • physical design