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Low-Cost Testing of High-Density Logic Components.
Robert W. Bassett
Barry J. Butkus
Stephen L. Dingle
Marc R. Faucher
Pamela S. Gillis
Jeannie H. Panner
John G. Petrovick
Donald L. Wheater
Published in:
IEEE Des. Test Comput. (1990)
Keyphrases
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high density
low cost
low density
high power
close proximity
magnetic recording
data center
high bandwidth
modal logic
thin film
low power
digital camera
logic programming
general purpose
neural network
magnetic tape
real time
database
automated reasoning