Tony Ambler

Publication Activity (10 Years)

Years Active: 1994-2006
Publications (10 Years): 0

Publications

Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. DFT (2006)
Yu-Ting Lin, Tony Ambler
An Economic Selecting Model for DFT Strategies. VTS (2005)
Il-soo Lee, Tony Ambler
Two efficient methods to reduce power and testing time. ISLPED (2005)
Yu-Ting Lin, Tony Ambler
A knowledge-based dispatching model for field service. SMC (2005)
Yu-Ting Lin, David Williams, Tony Ambler
Cost-effective designs of field service for electronic systems. ITC (2005)
Il-soo Lee, Yong Min Hur, Tony Ambler
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. Asian Test Symposium (2004)
Tony Ambler, Donald L. Wheater
Test Trade-Offs Take Center Stage at ITC. IEEE Des. Test Comput. 18 (5) (2001)
Louis Y. Ungar, Tony Ambler
Economics of Built-in Self-Test. IEEE Des. Test Comput. 18 (5) (2001)
Tony Ambler
Test Strategies and Marriage Partners. IEEE Des. Test Comput. 18 (5) (2001)
Dongho Kim, Tony Ambler
Robust transition density estimation by considering input/output transition behavior. ISCAS (5) (2001)
Tony Ambler, Ben Bennetts
Guest Editors' Introduction: Test and the Product Life Cycle. IEEE Des. Test Comput. 16 (3) (1999)
Tony Ambler, Magdy S. Abadir
Design and Test Economics-An Extra Dimension. IEEE Des. Test Comput. 14 (3) (1997)
Magdy S. Abadir, Tony Ambler
Introduction. J. Electron. Test. 5 (2-3) (1994)