Low Cost Testing of High Density Logic Components.
Robert W. BassettBarry J. ButkusStephen L. DingleMarc R. FaucherPamela S. GillisJeannie H. PannerJohn G. PetrovickDonald L. WheaterPublished in: ITC (1989)
Keyphrases
- high density
- low cost
- low density
- close proximity
- high power
- data center
- magnetic recording
- high bandwidth
- thin film
- real time
- low power
- classical logic
- cost effective
- building blocks
- digital camera
- field effect transistors
- logic programming
- software components
- logical framework
- test cases
- magnetic tape
- chemical vapor deposition