Login / Signup
Yield enhancement for 3D-stacked ICs: Recent advances and challenges.
Qiang Xu
Li Jiang
Huiyun Li
Bill Eklow
Published in:
ASP-DAC (2012)
Keyphrases
</>
recent advances
lessons learned
recent developments
researchers and practitioners
image enhancement
multimedia processing
field of pattern recognition
neural network
real world
image processing
computer vision
high order