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VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.

Laung-Terng WangXiaoqing WenShianling WuZhigang WangZhigang JiangBoryau SheuXinli Gu
Published in: IEEE Des. Test Comput. (2008)
Keyphrases
  • data compression
  • rapid development
  • case study
  • image compression
  • cost effective
  • neural network
  • test cases
  • compression scheme
  • st century
  • lossless compression
  • databases
  • data management
  • data processing
  • test data
  • cd rom