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VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.
Laung-Terng Wang
Xiaoqing Wen
Shianling Wu
Zhigang Wang
Zhigang Jiang
Boryau Sheu
Xinli Gu
Published in:
IEEE Des. Test Comput. (2008)
Keyphrases
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data compression
rapid development
case study
image compression
cost effective
neural network
test cases
compression scheme
st century
lossless compression
databases
data management
data processing
test data
cd rom