Re-Using DFT Logic for Functional and Silicon Debugging Test.

Xinli Gu Weili Wang Kevin Li Heon C. Kim Sung Soo Chung

Published in: ITC (2002)

Keyphrases

frequency domain
low cost
high density
high speed
signal processing
data sets
fourier transform
built in self test
predicate logic
defeasible logic
classical logic
automated reasoning
software testing
model based diagnosis
test cases
logic programming
software development
feature extraction