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Analysis and measurement of fault coverage in a combined ATE and BIST environment.
Hamidreza Hashempour
Fred J. Meyer
Fabrizio Lombardi
Published in:
IEEE Trans. Instrum. Meas. (2004)
Keyphrases
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statistical analysis
real time
neural network
data analysis
image processing
decision making
high level
digital libraries
artificial neural networks
image analysis
data acquisition