Login / Signup

Analysis and measurement of fault coverage in a combined ATE and BIST environment.

Hamidreza HashempourFred J. MeyerFabrizio Lombardi
Published in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
  • statistical analysis
  • real time
  • neural network
  • data analysis
  • image processing
  • decision making
  • high level
  • digital libraries
  • artificial neural networks
  • image analysis
  • data acquisition