Multiple fault detection in logic resources of FPGAs.
Wei Liang HuangFred J. MeyerFabrizio LombardiPublished in: DFT (1997)
Keyphrases
- fault detection
- industrial processes
- fault diagnosis
- condition monitoring
- fault identification
- failure detection
- tennessee eastman
- fault detection and diagnosis
- neural network
- machine learning
- rotating machinery
- fault detection and isolation
- management system
- control system
- fault isolation
- fault localization
- robust fault detection