Young Jun Schiano

Publication Activity (10 Years)

Years Active: 2003-2003
Publications (10 Years): 0

Publications

Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. 52 (6) (2003)