A New Method for Testing EEPLA's.
Avinash MunshiFred J. MeyerFabrizio LombardiPublished in: DFT (1998)
Keyphrases
- significant improvement
- high accuracy
- detection method
- high precision
- objective function
- classification accuracy
- main contribution
- mathematical model
- prior knowledge
- synthetic data
- support vector machine
- mutual information
- optimization method
- test data
- error rate
- clustering method
- experimental evaluation
- multiscale
- theoretical analysis
- feature selection
- cost function
- experimental study
- energy function
- training set
- classification method
- similarity measure
- image processing