Farzin Karimi

Publication Activity (10 Years)

Years Active: 2001-2008
Publications (10 Years): 0

Publications

Farzin Karimi
Applications of decorator and observer design patterns in functional verification. HLDVT (2008)
Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi
Using data compression in automatic test equipment for system-on-chip testing. IEEE Trans. Instrum. Meas. 53 (2) (2004)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
Hybrid Multisite Testing at Manufacturing. ITC (2003)
Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi
Parallel testing of multi-port static random access memories. Microelectron. J. 34 (1) (2003)
Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
Random Testing of Multi-Port Static Random Access Memories. MTDT (2002)
Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi
Data Compression for System-on-Chip Testing Using ATE. DFT (2002)
Farzin Karimi, Fabrizio Lombardi
A Scan-Bist Environment for Testing Embedded Memories. IOLTW (2002)
Farzin Karimi, Fabrizio Lombardi
A Scan-Bist Environment for Testing Embedded Memories. MTDT (2002)
Wenyi Feng, Farzin Karimi, Fabrizio Lombardi
Fault Detection in a Tristate System Environment. IEEE Micro 21 (5) (2001)
Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby
A Parallel Approach for Testing Multi-Port Static Random Access Memories. MTDT (2001)
Farzin Karimi, Fabrizio Lombardi
Parallel Testing of Multi-port Static Random Access Memories for BIST. DFT (2001)