Using data compression in automatic test equipment for system-on-chip testing.
Farzin KarimiZainalabedin NavabiWaleed MeleisFabrizio LombardiPublished in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
- data compression
- test cases
- compression algorithm
- data reduction
- compression ratio
- software testing
- compression scheme
- huffman coding
- test data
- statistical tests
- compressed data
- wavelet compression
- high compression
- wavelet filters
- test suite
- hardware and software
- test generation
- power consumption
- low complexity
- post processing
- classification accuracy
- preprocessing