A Scan-Bist Environment for Testing Embedded Memories.
Farzin KarimiFabrizio LombardiPublished in: MTDT (2002)
Keyphrases
- mobile robot
- real time
- information technology
- everyday objects
- control software
- autonomous agents
- dynamic environments
- expert systems
- search algorithm
- multi agent systems
- video sequences
- decision making
- computer vision
- software engineering
- social networks
- test set
- search engine
- learning community
- changing environment
- environmental conditions
- artificial intelligence
- neural network