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A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.

Fengming ZhangYoung-Jun LeeThomas KaneLuca SchianoMariam MomenzadehYong-Bin KimFred J. MeyerFabrizio LombardiSolomon MaxPhil Perkinson
Published in: DFT (2003)
Keyphrases
  • power consumption
  • statistical significance
  • computational power
  • digital image analysis
  • data mining
  • semi automatic
  • imaging technology
  • genetic algorithm
  • wide range
  • test data
  • fully automatic
  • data generator