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Testing and testable designs for one-time programmable FPGAs.
Tong Liu
Wei-Kang Huang
Fred J. Meyer
Fabrizio Lombardi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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general purpose
design principles
artificial intelligence
information systems
bayesian networks
low cost
test cases
test data