Login / Signup
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.
Ismed Hartanto
Srikanth Venkataraman
W. Kent Fuchs
Elizabeth M. Rudnick
Janak H. Patel
Sreejit Chakravarty
Published in:
ACM Trans. Design Autom. Electr. Syst. (2001)
Keyphrases
</>
model based diagnosis
fault isolation
fault diagnosis
fault detection
expert systems
high speed
test cases
sequential data
simulation model
fault models
diagnostic tests
simulation models
simulation environment
real time
simulation study
artificial neural networks
feature selection