C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
LFSR-Based Test Generation for Reduced Fail Data Volume.
Irith Pomeranz
Srikanth Venkataraman
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
</>
data sets
test generation
database
high quality
data analysis
data sources
image data
data model
software engineering
case study
training set