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Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.

Sybille HellebrandJanusz RajskiSteffen TarnickSrikanth VenkataramanBernard Courtois
Published in: IEEE Trans. Computers (1995)
Keyphrases
  • machine learning
  • neural network
  • closed form
  • low order
  • artificial neural networks
  • relevance feedback
  • electronic circuits