Paul J. Thadikaran

Publication Activity (10 Years)

Years Active: 1993-2009
Publications (10 Years): 0

Publications

Goutam Debnath, Paul J. Thadikaran
Design for Manufacturability and Reliability in Nano Era. VLSI Design (2009)
Goutam Debnath, Paul J. Thadikaran
Design Challenges for High Performance Nano-Technology. VLSI Design (2006)
Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
Extraction error modeling and automated model debugging in high-performance custom designs. IEEE Trans. Very Large Scale Integr. Syst. 14 (7) (2006)
Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. DATE (2005)
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran
Efficient techniques for transition testing. ACM Trans. Design Autom. Electr. Syst. 10 (2) (2005)
Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran
Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. VTS (2004)
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikaran, Andreas G. Veneris
Extraction Error Diagnosis and Correction in High-Performance Designs. ITC (2003)
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran
Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. J. Electron. Test. 19 (4) (2003)
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikaran, Andreas G. Veneris
Extraction Error Analysis, Diagnosis and Correction in Custom-Made High-Performance Designs. MTV (2003)
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran
Novel ATPG algorithms for transition faults. ETW (2002)
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran
Techniques to Reduce Data Volume and Application Time for Transition Test. ITC (2002)
Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel
test sets. ACM Trans. Design Autom. Electr. Syst. 2 (3) (1997)
Paul J. Thadikaran, Sreejit Chakravarty
Fast Algorithms for Computer IDDQ Tests for Combination Circuits. VLSI Design (1996)
Sreejit Chakravarty, Paul J. Thadikaran
Simulation and Generation of IDDQ Tests for Bridging Faults in Combinational Circuits. IEEE Trans. Computers 45 (10) (1996)
Sreejit Chakravarty, Paul J. Thadikaran
measurement points to detect bridging faults. J. Electron. Test. 8 (3) (1996)
Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel
Tests for Bridging Faults in Sequential Circuits. FTCS (1995)
Sreejit Chakravarty, Paul J. Thadikaran
Subset Selection Algorithms for Bridging Faults. ITC (1994)
Sreejit Chakravarty, Paul J. Thadikaran
tests for bridging faults in combinational circuits. VTS (1993)