Efficient techniques for transition testing.

Xiao Liu Michael S. Hsiao Sreejit Chakravarty Paul J. Thadikaran

Published in: ACM Trans. Design Autom. Electr. Syst. (2005)

Keyphrases

database
artificial intelligence
wide range
expert systems
lightweight
computationally expensive
real time
decision trees
bayesian networks
learning environment
computationally efficient
test set
cost effective