tests for bridging faults in combinational circuits.
Sreejit ChakravartyPaul J. ThadikaranPublished in: VTS (1993)
Keyphrases
- logic circuits
- test cases
- asynchronous circuits
- built in self test
- high speed
- fault diagnosis
- fault models
- fault detection
- delay insensitive
- databases
- analog circuits
- fault detection and isolation
- fault model
- test generation
- abnormal events
- power dissipation
- model based diagnosis
- integrated circuit
- test data
- search algorithm
- genetic algorithm
- data mining