Simulation and Generation of IDDQ Tests for Bridging Faults in Combinational Circuits.

Sreejit Chakravarty Paul J. Thadikaran

Published in: IEEE Trans. Computers (1996)

Keyphrases

logic circuits
test cases
fault diagnosis
simulation model
high speed
delay insensitive
asynchronous circuits
statistical tests
simulation models
fault models
data sets
correlation analysis
selected features
fault detection
model based diagnosis
simulation study
expert systems
training data
neural network