Tests for Bridging Faults in Sequential Circuits.
Paul J. ThadikaranSreejit ChakravartyJanak H. PatelPublished in: FTCS (1995)
Keyphrases
- test cases
- built in self test
- fault diagnosis
- fault models
- fault detection
- analog circuits
- high speed
- model based diagnosis
- circuit design
- multiscale
- logic circuits
- post hoc
- integrated circuit
- statistical tests
- fault detection and diagnosis
- electronic circuits
- diagnostic tests
- power reduction
- multiple faults
- test data